ColMatch - BIST Designer |
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Description Download Program manual Results References Contact |
Experimental ResultsISCAS BenchmarksIn order to evaluate the method we have performed several experiments on the standard ISCAS benchmarks, both the combinational and the full-scan versions of the sequential ones [1, 2]. First, the pseudo-random phase was run for "Rnd" cycles. After that, a fault simulation was performed, and "UD" undetected faults were found (the redundant faults are not considered). To detect these faults ATALANTA ATPG tool [3] created "ATPG" deterministic vectors. For these vectors and the "Det" LFSR vectors the column matching was run in its thorough search mode. After the column-matching process "M" matches were found, from which "DM" were direct matches. For the unmatched columns the output decoder logic was synthesized by BOOM [4, 5]. The complexity of the resulting circuit was measured in terms of gate equivalents. The "OD" gives the complexity of the output decoder, the "GEs" column shows the overall complexity, together with the switching logic. The overhead of a LFSR, MISR and the mode switching logic is not considered here. The "time" column indicates the average runtime of one column-matching pass.The experiments were performed on a Athlon XP-2500+ PC, Windows XP. [1] Brglez, F., Fujiwara, H.: A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in Fortan, Proc. of International Symposium on Circuits and Systems, pp. 663-698, 1985 [2] Brglez, F., Bryan, D., Kozminski, K.: Combinational Profiles of Sequential Benchmark Circuits, Proc. of International Symposium of Circuits and Systems, pp. 1929-1934, 1989 [3] Lee, H.K., Ha, D.S.: Atalanta: an Efficient ATPG for Combinational Circuits, Technical Report, 93-12, Dep't of Electrical Eng., Virginia Polytechnic Institute and State University, Blacksburg, Virginia, 1993 [4] Hlavička, J., Fišer, P.: BOOM - a Heuristic Boolean Minimizer. Proc. International Conference on Computer-Aided Design ICCAD 2001, San Jose, California (USA), 4.-8.11.2001, pp. 439-442 [5] http://ddd.fit.cvut.cz/prj/BOOM
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