References

• P. Fišer and H. Kubátová, "Column-Matching Based Mixed-Mode Test Pattern Generator Design Technique for BIST," in Microprocessors and Microsystems journal, Dependability and Testing of Modern Digital Systems special issue, Elsevier, vol. 32, issues 5-6, August 2008, pp. 340-350.
• P. Fišer and H. Kubátová, "Scalable Test Pattern Generator Design Method for BIST," in Proc. of 9th IEEE Latin-American Test Workshop (LATW), Puebla (Mexico), February 17-20, 2008, pp. 69-74.
• P. Fišer and H. Kubátová, "Pseudo-Random Pattern Generator Design for Column Matching BIST," in Proc. of 10th Euromicro Conference on Digital Systems Design (DSD), Lübeck (Germany), July 27-31, 2007, pp. 657-663.
• P. Fišer and H. Kubátová, "Multiple-Vector Column-Matching BIST Design Method," in Proc. of 9th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS), Prague (CR), April 18-21, 2006, pp. 268-273.
• P. Fišer and H. Kubátová, "Improvement of the Fault Coverage of the Pseudo-Random Phase in Column Matching BIST," in Proc. of 31th Euromicro Symposium on Digital Systems Design (DSD), Porto, (Portugal), August 30-September 3, 2005, pp. 56-63.
• P. Fišer and H. Kubátová, "Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST," in Proc. of 9th Biennial Baltic Electronics Conference (BEC), Tallinn (Estonia), October 3-6, 2004, pp. 201-204.
• P. Fišer and H. Kubátová, "Pseudorandom Testability, Study of the Effect of the Generator Type," in Proc. of International Scientific Conference Electronic Computers and Informatics (ECI), Herľany (SR), September 22-24, 2004, pp. 200-205.
• P. Fišer and H. Kubátová, "Survey of the Algorithms in the Column-Matching BIST Method," in Proc. of 10th International On-Line Testing Symposium (IOLTS), Madeira (Portugal), July 12-14, 2004, pp. 181.
• P. Fišer and H. Kubátová, "An Efficient Mixed-Mode BIST Technique," in Proc. of 7th IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS), Tatranská Lomnica (SK), April 18-21, 2004, pp. 227-230.
• P. Fišer, J. Hlavička, and H. Kubátová, "Column-Matching BIST Exploiting Test Don't-Cares," in Proc. of 8th IEEE European Test Workshop (ETW), Maastricht (The Netherlands), May 25-28, 2003, pp. 215-216.
• P. Fišer and J. Hlavička, "Column-Matching Based BIST Design Method," in Proc. of 7th IEEE European Test Workshop (ETW), Corfu (Greece), May 26-29, 2002, pp. 15-16.