@ARTICLE{867894, 
author={Corno, F. and Reorda, M.S. and Squillero, G.}, 
journal={Design Test of Computers, IEEE}, 
title={RT-level ITC'99 benchmarks and first ATPG results}, 
year={2000}, 
month={Jul}, 
volume={17}, 
number={3}, 
pages={44-53}, 
keywords={Automatic test pattern generation;Logic testing;Performance evaluation;ATPG;ATPG tools;RT-level benchmarks;Algorithm design and analysis;Automatic test pattern generation;Automatic testing;Benchmark testing;Circuit faults;Circuit synthesis;Circuit testing;Libraries;Logic testing;Prototypes}, 
doi={10.1109/54.867894}, 
ISSN={0740-7475},}